#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204464
Mfr serial number	STN11764-04464

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204464

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.13857
I_LEAK350V (microA)	0.2123
Substr Origin	124
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	70
R Bias Upper (MOhm)	1.68
R Bias Lower (MOhm)	1.16

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	43.92
20	63.21
30	72.86
40	80.12
50	86.29
60	92.26
70	98.38
80	104.23
90	109.69
100	114.96
110	119.83
120	124.89
130	129.49
140	134.03
150	138.57
160	142.91
170	147.09
180	151.29
190	155.31
200	159.21
210	163.19
220	166.98
230	170.69
240	174.42
250	178.12
260	181.7
270	185.1
280	188.6
290	192
300	195.5
310	198.9
320	202.2
330	205.5
340	208.9
350	212.3
	
#CV	
10	
15	O.L.
20	O.L.
25	2761.71
30	2374.81
35	2104.74
40	1902.37
45	1747.67
50	1627.26
55	1537.23
60	1477.95
65	1445.08
70	1429.54
75	1422.52
80	1419.09
85	1416.92
90	1415.25
95	1413.93
100	1412.88
105	1411.97
110	1411.12
115	1410.39
120	1409.66

#End of manufacturer data file