#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204465
Mfr serial number	STN11764-04465

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204465

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.14681
I_LEAK350V (microA)	0.2268
Substr Origin	124
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	65
R Bias Upper (MOhm)	1.68
R Bias Lower (MOhm)	1.16

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	599																																							
Pinhole	629																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA	
#IV	
10	45.57
20	65.88
30	76.05
40	83.81
50	90.76
60	97.07
70	103.65
80	110.07
90	116.02
100	121.63
110	126.98
120	132.23
130	137.17
140	142
150	146.81
160	151.39
170	155.91
180	160.15
190	164.7
200	169.07
210	173.34
220	177.5
230	181.5
240	185.4
250	189.5
260	193.3
270	197.1
280	200.9
290	204.7
300	208.3
310	212.1
320	215.8
330	219.5
340	223.2
350	226.8
	
#CV	
10	
15	O.L.
20	O.L.
25	2729.05
30	2347.63
35	2080.89
40	1881
45	1728.7
50	1610.94
55	1525.11
60	1470.92
65	1441.94
70	1428.65
75	1422.71
80	1419.6
85	1417.58
90	1416.08
95	1414.8
100	1413.74
105	1412.85
110	1412.09
115	1411.41
120	1410.66

#End of manufacturer data file