#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204467
Mfr serial number	STN11764-04467

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204467

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.1497
I_LEAK350V (microA)	0.2378
Substr Origin	124
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.68
R Bias Lower (MOhm)	1.16

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	45.71
20	65.98
30	75.93
40	83.57
50	90.04
60	96.76
70	103.61
80	110.52
90	116.81
100	122.82
110	128.46
120	134.05
130	139.34
140	144.49
150	149.7
160	154.71
170	159.45
180	164.29
190	168.95
200	173.71
210	178.5
220	182.7
230	187.5
240	191.9
250	196.4
260	200.7
270	205.1
280	209.5
290	213.7
300	217.8
310	221.9
320	226
330	230
340	234
350	237.8
	
#CV	
10	
15	O.L.
20	O.L.
25	2465.21
30	2123.28
35	1883.73
40	1708.3
45	1583.09
50	1500.88
55	1454.45
60	1432.35
65	1422.56
70	1418.06
75	1415.35
80	1413.53
85	1411.93
90	1410.71
95	1409.58
100	1408.6
105	1407.67
110	1407.01
115	1406.33
120	1405.69

#End of manufacturer data file