#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204468
Mfr serial number	STN11764-04468

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204468

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.15248
I_LEAK350V (microA)	0.2428
Substr Origin	124
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	65
R Bias Upper (MOhm)	1.68
R Bias Lower (MOhm)	1.16

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	0																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	45.99
20	66.58
30	76.94
40	84.88
50	92.1
60	98.6
70	105.14
80	112.12
90	118.71
100	124.87
110	130.57
120	136.44
130	141.88
140	147.2
150	152.48
160	157.62
170	162.66
180	167.63
190	172.38
200	177.14
210	181.8
220	186.5
230	191
240	195.5
250	200.1
260	204.5
270	208.9
280	213.4
290	217.9
300	222.2
310	226.3
320	230.4
330	234.5
340	238.6
350	242.8
	
#CV	
10	
15	O.L.
20	O.L.
25	2604.98
30	2243.51
35	1990.22
40	1801.58
45	1660.14
50	1555.92
55	1486.8
60	1448.53
65	1430.26
70	1422.17
75	1418.24
80	1415.84
85	1414.03
90	1412.64
95	1411.44
100	1410.44
105	1409.52
110	1408.68
115	1408.03
120	1407.44

#End of manufacturer data file