#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204469
Mfr serial number	STN11764-04469

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204469

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.14757
I_LEAK350V (microA)	0.232
Substr Origin	124
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	65
R Bias Upper (MOhm)	1.68
R Bias Lower (MOhm)	1.16

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	45.23
20	65.26
30	75.28
40	82.83
50	89.65
60	96.15
70	102.96
80	109.66
90	115.73
100	121.49
110	127.04
120	132.42
130	137.57
140	142.56
150	147.57
160	152.4
170	157.13
180	161.58
190	166.31
200	170.71
210	175.17
220	179.44
230	183.7
240	187.9
250	192
260	196.1
270	200.2
280	204.3
290	208.3
300	212.3
310	216.3
320	220.2
330	224.2
340	228.2
350	232
	
#CV	
10	
15	O.L.
20	O.L.
25	2599.79
30	2237.98
35	1984.79
40	1795.38
45	1653.51
50	1549.53
55	1481.89
60	1445.13
65	1427.9
70	1420.27
75	1416.57
80	1414.25
85	1412.47
90	1411.16
95	1410.01
100	1408.94
105	1408.12
110	1407.38
115	1406.68
120	1406.06

#End of manufacturer data file