#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204471
Mfr serial number	STN11764-04471

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204471

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.14014
I_LEAK350V (microA)	0.2164
Substr Origin	124
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	65
R Bias Upper (MOhm)	1.68
R Bias Lower (MOhm)	1.16

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	42.47
20	60.81
30	69.97
40	77.68
50	84.8
60	91.26
70	97.52
80	104.1
90	110
100	115.41
110	120.87
120	125.94
130	130.73
140	135.49
150	140.14
160	144.72
170	149.05
180	153.52
190	157.71
200	161.81
210	165.98
220	169.95
230	173.86
240	177.7
250	181.4
260	185.1
270	188.7
280	192.3
290	195.7
300	199.2
310	202.8
320	206.2
330	209.6
340	213.1
350	216.4
	
#CV	
10	
15	O.L.
20	O.L.
25	2550.41
30	2195.87
35	1947.43
40	1762.89
45	1627.19
50	1531.29
55	1471.22
60	1439.21
65	1424.16
70	1417.17
75	1413.51
80	1411.3
85	1409.71
90	1408.28
95	1407.18
100	1406.29
105	1405.53
110	1404.75
115	1404.1
120	1403.42

#End of manufacturer data file