#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204474
Mfr serial number	STN11764-04474

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204474

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.1302
I_LEAK350V (microA)	0.2031
Substr Origin	124
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	65
R Bias Upper (MOhm)	1.68
R Bias Lower (MOhm)	1.16

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	40.97
20	58.67
30	67.37
40	74.06
50	80.08
60	85.59
70	91.59
80	97.19
90	102.47
100	107.51
110	112.32
120	117.06
130	121.51
140	125.9
150	130.2
160	134.42
170	138.48
180	142.33
190	146.43
200	150.36
210	154.33
220	158.13
230	162
240	165.72
250	169.51
260	173.25
270	176.74
280	180.3
290	183.7
300	187.3
310	190.7
320	194
330	196.8
340	200.3
350	203.1
	
#CV	
10	
15	O.L.
20	O.L.
25	2584.83
30	2223.25
35	1969.55
40	1782
45	1640.81
50	1537.91
55	1472.42
60	1437.88
65	1422.15
70	1415.19
75	1411.68
80	1409.51
85	1407.87
90	1406.6
95	1405.54
100	1404.57
105	1403.69
110	1403.05
115	1402.48
120	1401.86

#End of manufacturer data file