#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204475
Mfr serial number	STN11764-04475

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204475

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.11514
I_LEAK350V (microA)	0.17669
Substr Origin	124
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	65
R Bias Upper (MOhm)	1.68
R Bias Lower (MOhm)	1.16

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	646																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	36.99
20	52.62
30	60.25
40	66.06
50	71.29
60	76.03
70	80.92
80	86.02
90	90.78
100	95.3
110	99.53
120	103.65
130	107.55
140	111.37
150	115.14
160	118.57
170	122.29
180	125.81
190	129.22
200	132.52
210	135.84
220	139.08
230	142.18
240	145.27
250	148.35
260	151.26
270	154.16
280	157.14
290	160
300	162.85
310	165.69
320	168.45
330	171.21
340	173.97
350	176.69
	
#CV	
10	
15	O.L.
20	O.L.
25	2600.64
30	2238.27
35	1983.99
40	1795.3
45	1653.4
50	1549.25
55	1481.29
60	1443.84
65	1426.04
70	1418.33
75	1414.62
80	1412.35
85	1410.7
90	1409.36
95	1408.3
100	1407.29
105	1406.44
110	1405.72
115	1405.18
120	1404.51

#End of manufacturer data file