#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204476
Mfr serial number	STN11764-04476

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204476

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.11895
I_LEAK350V (microA)	0.1833
Substr Origin	124
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	65
R Bias Upper (MOhm)	1.68
R Bias Lower (MOhm)	1.16

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	332																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	37.97
20	53.92
30	61.72
40	67.76
50	73.17
60	78.18
70	83.29
80	88.6
90	93.57
100	98.23
110	102.65
120	106.96
130	111.05
140	114.99
150	118.95
160	122.74
170	126.42
180	129.93
190	133.67
200	137.21
210	140.65
220	143.98
230	147.25
240	150.41
250	153.61
260	156.75
270	159.85
280	162.93
290	165.94
300	168.91
310	171.91
320	174.82
330	177.66
340	180.54
350	183.3
	
#CV	
10	
15	O.L.
20	O.L.
25	2601.89
30	2238.78
35	1984.09
40	1795.19
45	1653.25
50	1549.17
55	1480.18
60	1441.31
65	1422.96
70	1415.06
75	1411.32
80	1408.97
85	1407.33
90	1406.09
95	1404.91
100	1403.95
105	1403.14
110	1402.32
115	1401.73
120	1401.08

#End of manufacturer data file