#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204477
Mfr serial number	STN11764-04477

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204477

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.12599
I_LEAK350V (microA)	0.1955
Substr Origin	124
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	65
R Bias Upper (MOhm)	1.68
R Bias Lower (MOhm)	1.16

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	218																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	39.9
20	56.69
30	65
40	71.28
50	77.03
60	82.81
70	88.6
80	94.07
90	99.18
100	104.02
110	108.69
120	113.23
130	117.6
140	121.75
150	125.99
160	129.8
170	134.01
180	137.92
190	141.72
200	145.44
210	149.08
220	152.69
230	156.14
240	159.65
250	163.1
260	166.43
270	169.73
280	173.1
290	176.37
300	179.58
310	182.8
320	186
330	189.1
340	192.3
350	195.5
	
#CV	
10	
15	O.L.
20	O.L.
25	2603.56
30	2240.85
35	1986.15
40	1796.57
45	1653.94
50	1549.64
55	1481.63
60	1444.39
65	1426.89
70	1419.16
75	1415.47
80	1413.2
85	1411.55
90	1410.23
95	1409.17
100	1408.25
105	1407.39
110	1406.57
115	1405.93
120	1405.36

#End of manufacturer data file