#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204478
Mfr serial number	STN11764-04478

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204478

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.13413
I_LEAK350V (microA)	0.206
Substr Origin	124
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	65
R Bias Upper (MOhm)	1.68
R Bias Lower (MOhm)	1.16

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	408																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	42.1
20	60.4
30	69.4
40	76.14
50	82.28
60	88.79
70	94.92
80	100.6
90	105.95
100	111.06
110	115.98
120	120.77
130	125.3
140	129.53
150	134.13
160	138.36
170	142.49
180	146.61
190	150.51
200	154.29
210	158.19
220	161.95
230	165.59
240	169.22
250	172.82
260	176.34
270	179.8
280	183.2
290	186.5
300	189.9
310	193.2
320	196.4
330	199.7
340	202.9
350	206
	
#CV	
10	
15	O.L.
20	O.L.
25	2615.03
30	2250.2
35	1994.09
40	1803.27
45	1659.61
50	1554.03
55	1484.91
60	1447.06
65	1429.29
70	1421.52
75	1417.74
80	1415.5
85	1413.82
90	1412.45
95	1411.34
100	1410.31
105	1409.52
110	1408.76
115	1408.14
120	1407.52

#End of manufacturer data file