#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204479
Mfr serial number	STN11764-04479

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204479

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.13837
I_LEAK350V (microA)	0.2147
Substr Origin	124
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	65
R Bias Upper (MOhm)	1.68
R Bias Lower (MOhm)	1.16

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	505																																							
Pinhole	527																																							
Pinhole	538																																							
Pinhole	578																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section	
%RAWDATA	
DATA	
#IV	
10	44.02
20	63.13
30	72.61
40	79.87
50	86.32
60	92.11
70	98.28
80	104.19
90	109.69
100	114.89
110	119.87
120	124.75
130	129.36
140	133.87
150	138.37
160	142.67
170	146.92
180	151.19
190	155.24
200	159.3
210	163.37
220	167.26
230	171.3
240	175.22
250	179.09
260	182.7
270	186.2
280	190
290	193.5
300	197.2
310	200.8
320	204.3
330	207.7
340	211.2
350	214.7
	
#CV	
10	
15	O.L.
20	O.L.
25	2648.23
30	2277.95
35	2018.51
40	1825.09
45	1678.96
50	1568.95
55	1494.56
60	1452.47
65	1432.36
70	1423.57
75	1419.48
80	1417.03
85	1415.23
90	1413.88
95	1412.8
100	1411.74
105	1410.91
110	1410.14
115	1409.54
120	1408.8

#End of manufacturer data file