#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204480
Mfr serial number	STN11764-04480

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204480

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.14459
I_LEAK350V (microA)	0.2287
Substr Origin	124
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	65
R Bias Upper (MOhm)	1.68
R Bias Lower (MOhm)	1.16

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	385																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	45.21
20	64.68
30	74.56
40	82.07
50	88.96
60	95.44
70	102.11
80	108.22
90	114
100	119.51
110	124.81
120	130.02
130	134.93
140	139.78
150	144.59
160	148.99
170	153.84
180	158.42
190	162.88
200	167.23
210	171.67
220	175.96
230	180.15
240	184.3
250	188.4
260	192.5
270	196.6
280	200.8
290	205
300	209.3
310	213.3
320	217.5
330	221.3
340	224.8
350	228.7
	
#CV	
10	
15	O.L.
20	O.L.
25	2662.82
30	2290.65
35	2029.34
40	1834.43
45	1686.54
50	1574.81
55	1498.36
60	1453.8
65	1431.65
70	1421.91
75	1417.36
80	1414.87
85	1413.03
90	1411.71
95	1410.63
100	1409.6
105	1408.71
110	1408.01
115	1407.38
120	1406.81

#End of manufacturer data file