#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204481
Mfr serial number	STN11764-04481

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204481

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.13095
I_LEAK350V (microA)	0.2028
Substr Origin	124
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	65
R Bias Upper (MOhm)	1.68
R Bias Lower (MOhm)	1.16

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	41.58
20	59.1
30	67.73
40	74.24
50	80.31
60	86.08
70	92.14
80	97.86
90	103.18
100	108.23
110	113.08
120	117.79
130	122.26
140	126.62
150	130.95
160	135.12
170	138.94
180	143.28
190	147.19
200	151.03
210	154.82
220	158.49
230	162.17
240	165.72
250	169.28
260	172.71
270	176.21
280	179.65
290	183
300	186.3
310	189.7
320	192.9
330	196.2
340	199.6
350	202.8
	
#CV	
10	
15	O.L.
20	O.L.
25	2597.06
30	2235.96
35	1982.65
40	1794.08
45	1652.31
50	1548.49
55	1481.16
60	1444.36
65	1427.09
70	1419.42
75	1415.73
80	1413.41
85	1411.76
90	1410.55
95	1409.41
100	1408.51
105	1407.67
110	1406.97
115	1406.27
120	1405.74

#End of manufacturer data file