#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204486
Mfr serial number	STN11765-04486

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204486

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.11993
I_LEAK350V (microA)	0.17724
Substr Origin	123
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	65
R Bias Upper (MOhm)	1.52
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	502																																							
Pinhole	563																																							
Pinhole	579																																							
Pinhole	648																																							
Pinhole	652																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section	
%RAWDATA	
DATA	
#IV	
10	43.18
20	59.68
30	67.79
40	73.66
50	78.58
60	83.46
70	88.65
80	93.39
90	97.72
100	101.82
110	105.71
120	109.38
130	112.99
140	116.51
150	119.93
160	123.24
170	126.3
180	129.69
190	132.85
200	136.01
210	139.1
220	142.08
230	144.99
240	147.88
250	150.7
260	153.53
270	156.02
280	158.93
290	161.71
300	164.36
310	167
320	169.66
330	172.25
340	174.8
350	177.24
	
#CV	
10	
15	O.L.
20	O.L.
25	2641.56
30	2274.21
35	2017.16
40	1825.24
45	1680.14
50	1571.02
55	1496.66
60	1454.09
65	1433.34
70	1423.93
75	1419.51
80	1416.81
85	1415.11
90	1413.6
95	1412.31
100	1411.52
105	1410.41
110	1409.6
115	1409.18
120	1408.46

#End of manufacturer data file