#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204487
Mfr serial number	STN11765-04487

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204487

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.1171
I_LEAK350V (microA)	0.17178
Substr Origin	123
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	65
R Bias Upper (MOhm)	1.52
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	42.36
20	58.98
30	66.39
40	72.27
50	77.1
60	81.79
70	86.64
80	91.23
90	95.44
100	99.44
110	103.21
120	106.74
130	110.38
140	113.77
150	117.1
160	120.36
170	123.47
180	126.57
190	129.6
200	132.56
210	135.49
220	138.21
230	141.15
240	143.89
250	146.54
260	149.21
270	151.83
280	154.43
290	156.98
300	159.52
310	162
320	164.32
330	166.96
340	169.39
350	171.78
	
#CV	
10	
15	O.L.
20	O.L.
25	2668.98
30	2299.37
35	2040.57
40	1847.77
45	1701.03
50	1589.26
55	1510.67
60	1462.48
65	1437.59
70	1426.38
75	1421.14
80	1418.15
85	1416.13
90	1414.76
95	1413.42
100	1412.41
105	1411.47
110	1410.64
115	1409.79
120	1409.12

#End of manufacturer data file