#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204488
Mfr serial number	STN11765-04488

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204488

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.12222
I_LEAK350V (microA)	0.1815
Substr Origin	123
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	65
R Bias Upper (MOhm)	1.52
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	379																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	43.02
20	60.07
30	68.34
40	74.4
50	79.42
60	84.53
70	89.72
80	94.57
90	99.08
100	103.23
110	107.36
120	111.22
130	114.97
140	118.62
150	122.22
160	125.7
170	129.06
180	132.43
190	135.74
200	138.86
210	142.16
220	145.27
230	148.26
240	151.23
250	154.15
260	157.03
270	159.79
280	162.63
290	165.37
300	167.96
310	170.82
320	173.47
330	176.17
340	178.77
350	181.5
	
#CV	
10	
15	O.L.
20	O.L.
25	2586.05
30	2229.1
35	1978.42
40	1792.94
45	1652.73
50	1550.32
55	1483.1
60	1446
65	1428.45
70	1420.36
75	1416.45
80	1414.08
85	1412.24
90	1410.94
95	1409.72
100	1408.78
105	1407.93
110	1407.04
115	1406.2
120	1405.76

#End of manufacturer data file