#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204491
Mfr serial number	STN11765-04491

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204491

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.11643
I_LEAK350V (microA)	0.17211
Substr Origin	123
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	65
R Bias Upper (MOhm)	1.52
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	41.77
20	58.39
30	65.58
40	71.45
50	76.27
60	81.07
70	85.89
80	90.36
90	94.53
100	98.52
110	102.32
120	105.83
130	109.57
140	113
150	116.43
160	119.66
170	122.83
180	126
190	129.12
200	132.22
210	135.23
220	137.89
230	140.89
240	143.66
250	146.33
260	149.02
270	151.63
280	154.23
290	156.88
300	159.55
310	162.18
320	164.51
330	167.25
340	169.68
350	172.11
	
#CV	
10	
15	O.L.
20	O.L.
25	2622.56
30	2259.54
35	2005.25
40	1815.65
45	1671.77
50	1563.72
55	1490.7
60	1449.49
65	1429.53
70	1420.39
75	1415.82
80	1413.22
85	1411.52
90	1410.1
95	1408.84
100	1407.79
105	1407.04
110	1406.1
115	1405.29
120	1404.71

#End of manufacturer data file