#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204495
Mfr serial number	STN11765-04495

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204495

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.12799
I_LEAK350V (microA)	0.1941
Substr Origin	123
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	65
R Bias Upper (MOhm)	1.52
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	43.66
20	61.1
30	69.65
40	75.89
50	81.64
60	86.97
70	92.5
80	97.8
90	102.73
100	107.41
110	111.83
120	116.06
130	120.19
140	124.24
150	127.99
160	131.97
170	135.63
180	139.34
190	142.96
200	146.55
210	150.04
220	153.52
230	156.88
240	160.13
250	163.15
260	166.66
270	169.8
280	172.95
290	176.07
300	179.2
310	182.3
320	185.4
330	188.29
340	191.2
350	194.1
	
#CV	
10	
15	O.L.
20	O.L.
25	2582.9
30	2225.32
35	1974.69
40	1788.98
45	1650.26
50	1549.96
55	1484.52
60	1448.5
65	1431.52
70	1423.76
75	1419.91
80	1417.64
85	1415.93
90	1414.5
95	1413.48
100	1412.42
105	1411.51
110	1410.64
115	1410.11
120	1409.46

#End of manufacturer data file