#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204496
Mfr serial number	STN11765-04496

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204496

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.12082
I_LEAK350V (microA)	0.1804
Substr Origin	123
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	60
R Bias Upper (MOhm)	1.52
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	42.16
20	59.2
30	66.6
40	72.52
50	77.52
60	82.55
70	87.84
80	92.86
90	97.44
100	101.76
110	105.86
120	109.61
130	113.52
140	117.2
150	120.82
160	124.3
170	127.66
180	131.05
190	134.33
200	137.6
210	140.71
220	143.65
230	146.88
240	149.9
250	152.87
260	155.67
270	158.53
280	161.4
290	164.22
300	166.93
310	169.65
320	172.15
330	175.03
340	177.7
350	180.4
	
#CV	
10	
15	O.L.
20	O.L.
25	2559.47
30	2203.68
35	1954.34
40	1769.6
45	1631.72
50	1534.09
55	1474.06
60	1443.28
65	1429.41
70	1423.34
75	1420.16
80	1417.97
85	1416.27
90	1415.09
95	1413.85
100	1412.9
105	1411.95
110	1411.22
115	1410.53
120	1410

#End of manufacturer data file