#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204497
Mfr serial number	STN11765-04497

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204497

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.12156
I_LEAK350V (microA)	0.1817
Substr Origin	123
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	60
R Bias Upper (MOhm)	1.52
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	41.59
20	58.98
30	66.45
40	72.35
50	77.32
60	82.32
70	87.87
80	93.07
90	97.77
100	102.23
110	106.38
120	110.23
130	114.2
140	117.94
150	121.56
160	125.08
170	128.47
180	131.91
190	135.22
200	138.52
210	141.76
220	144.76
230	148.01
240	151.05
250	154.04
260	157.01
270	159.88
280	162.7
290	165.54
300	168.35
310	171.05
320	173.55
330	176.41
340	179.07
350	181.7
	
#CV	
10	
15	O.L.
20	O.L.
25	2541.32
30	2188.31
35	1940.7
40	1758.25
45	1622.16
50	1526.08
55	1468.27
60	1440.09
65	1428.05
70	1422.94
75	1419.91
80	1417.81
85	1416.18
90	1414.89
95	1413.81
100	1412.73
105	1411.86
110	1411.19
115	1410.46
120	1409.77

#End of manufacturer data file