#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204507
Mfr serial number	STN11765-04507

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	22/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204507

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.106
I_LEAK350V (microA)	0.15513
Substr Origin	123
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.52
R Bias Lower (MOhm)	1.32

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	18																																							
Pinhole	362																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA	
#IV	
10	35.72
20	53.17
30	60.02
40	64.98
50	69.32
60	73.78
70	78.22
80	82.43
90	86.3
100	89.92
110	93.37
120	96.67
130	99.87
140	102.86
150	106
160	108.93
170	111.74
180	114.54
190	117.3
200	120
210	122.62
220	125.23
230	127.75
240	130.09
250	132.64
260	135.01
270	137.34
280	139.66
290	141.97
300	144.22
310	146.46
320	148.68
330	150.88
340	152.88
350	155.13
	
#CV	
10	
15	O.L.
20	2892.38
25	2370.88
30	2042.17
35	1812.09
40	1651.04
45	1543.76
50	1480.22
55	1447.59
60	1432.23
65	1425.13
70	1421.34
75	1418.87
80	1417.11
85	1415.72
90	1414.38
95	1413.39
100	1412.59
105	1411.81
110	1410.91
115	1410.48
120	1409.72

#End of manufacturer data file