#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204536
Mfr serial number	STN11768-04536

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	24/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204536

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.17986
I_LEAK350V (microA)	0.2406
Substr Origin	132
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	60
R Bias Upper (MOhm)	1.43
R Bias Lower (MOhm)	1.34

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	38																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	79.24
20	104.57
30	119.3
40	128.99
50	135.91
60	141.61
70	146.86
80	151.77
90	156.36
100	160.69
110	164.82
120	168.82
130	172.56
140	176.2
150	179.86
160	183.2
170	186.7
180	190
190	193.3
200	196.6
210	199.8
220	202.9
230	206
240	209
250	212.1
260	215
270	217.9
280	220.9
290	223.8
300	226.6
310	229.3
320	232.3
330	235
340	237.9
350	240.6
	
#CV	
10	
15	O.L.
20	2981.13
25	2455.68
30	2118.58
35	1881.02
40	1707.05
45	1581.13
50	1499.2
55	1452.89
60	1431.12
65	1421.8
70	1417.49
75	1415
80	1413.27
85	1411.88
90	1410.84
95	1409.9
100	1409.08
105	1408.43
110	1408.03
115	1407.37
120	1406.88

#End of manufacturer data file