#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204539
Mfr serial number	STN11768-04539

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	24/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204539

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.11301
I_LEAK350V (microA)	0.1741
Substr Origin	132
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	293
Vdep (V)	55
R Bias Upper (MOhm)	1.43
R Bias Lower (MOhm)	1.34

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	36.61
20	51.1
30	58.36
40	63.83
50	68.91
60	74.27
70	79.68
80	84.58
90	89.27
100	93.56
110	97.58
120	101.79
130	105.57
140	109.29
150	113.01
160	116.52
170	120.05
180	123.43
190	126.84
200	130.13
210	133.38
220	136.43
230	139.58
240	142.59
250	145.71
260	148.6
270	151.49
280	154.49
290	157.31
300	160.17
310	163.05
320	165.77
330	168.61
340	171.37
350	174.1
	
#CV	
10	
15	O.L.
20	2846.27
25	2340.09
30	2019.44
35	1795.97
40	1637.09
45	1530.88
50	1470.44
55	1440.54
60	1427.49
65	1421.47
70	1418.19
75	1415.91
80	1414.05
85	1412.59
90	1411.39
95	1410.26
100	1409.21
105	1408.31
110	1407.56
115	1406.85
120	1406.08

#End of manufacturer data file