#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204542
Mfr serial number	STN11768-04542

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	24/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204542

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.12338
I_LEAK350V (microA)	0.1876
Substr Origin	132
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	55
R Bias Upper (MOhm)	1.43
R Bias Lower (MOhm)	1.34

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	41
20	57.68
30	65.61
40	71.37
50	76.81
60	82.69
70	88.26
80	93.44
90	98.3
100	102.87
110	107.26
120	111.36
130	115.54
140	119.48
150	123.38
160	127.12
170	130.79
180	134.44
190	137.97
200	141.44
210	144.89
220	148.22
230	151.48
240	154.64
250	157.87
260	161.01
270	164.11
280	167.22
290	170.25
300	173.28
310	176.34
320	179.27
330	182.1
340	184.8
350	187.6
	
#CV	
10	
15	O.L.
20	2824.92
25	2323.23
30	2004.57
35	1782.02
40	1624.31
45	1520.03
50	1461.19
55	1432.29
60	1419.94
65	1414.4
70	1411.5
75	1409.59
80	1408.03
85	1406.72
90	1405.6
95	1404.74
100	1403.88
105	1403.18
110	1402.58
115	1402.1
120	1401.54

#End of manufacturer data file