#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204544
Mfr serial number	STN11768-04544

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	24/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204544

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.10967
I_LEAK350V (microA)	0.16693
Substr Origin	132
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	55
R Bias Upper (MOhm)	1.43
R Bias Lower (MOhm)	1.34

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	35.15
20	49.43
30	56.48
40	61.93
50	67.22
60	72.67
70	77.85
80	82.6
90	86.97
100	91.16
110	95.17
120	98.98
130	102.63
140	106.16
150	109.67
160	113.04
170	116.3
180	119.59
190	122.73
200	125.79
210	128.9
220	131.9
230	134.78
240	137.72
250	140.63
260	143.44
270	146.11
280	148.83
290	151.5
300	154.21
310	156.91
320	159.54
330	162.11
340	164.71
350	166.93
	
#CV	
10	
15	O.L.
20	2826.86
25	2328.08
30	2010.61
35	1788.22
40	1629.76
45	1524.88
50	1466.09
55	1437.64
60	1425.45
65	1419.87
70	1416.92
75	1414.82
80	1413.28
85	1411.98
90	1410.88
95	1409.97
100	1409.06
105	1408.4
110	1407.88
115	1407.25
120	1406.82

#End of manufacturer data file