#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204546
Mfr serial number	STN11768-04546

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	24/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204546

#Test data Data section	
%DATA	
TEMPERATURE (C)	27
I_LEAK150V (microA)	0.10569
I_LEAK350V (microA)	0.16112
Substr Origin	125
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	60
R Bias Upper (MOhm)	1.43
R Bias Lower (MOhm)	1.34

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	33.87
20	48.77
30	55.64
40	60.74
50	65.24
60	70.12
70	74.97
80	79.48
90	83.71
100	87.75
110	91.59
120	95.35
130	98.84
140	102.28
150	105.69
160	108.96
170	112.17
180	115.19
190	118.43
200	121.46
210	124.46
220	127.39
230	130.25
240	133.08
250	135.88
260	138.63
270	141.24
280	143.84
290	146.2
300	148.68
310	151.35
320	153.84
330	156.29
340	158.73
350	161.12
	
#CV	
10	
15	O.L.
20	2970.86
25	2445.12
30	2110.17
35	1874.81
40	1702.33
45	1577.95
50	1497.73
55	1453.24
60	1432.7
65	1423.74
70	1419.61
75	1417.07
80	1415.3
85	1413.9
90	1412.74
95	1411.77
100	1410.82
105	1409.97
110	1409.35
115	1408.77
120	1408.27

#End of manufacturer data file