#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204588
Mfr serial number	STN11770-04588

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204588

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.11478
I_LEAK350V (microA)	0.172
Substr Origin	125
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	60
R Bias Upper (MOhm)	1.44
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	37.73
20	53.92
30	61.84
40	67.66
50	72.6
60	77.49
70	82.59
80	87.44
90	91.99
100	96.19
110	100.21
120	104.07
130	107.74
140	111.3
150	114.78
160	118.02
170	121.48
180	124.7
190	127.87
200	131
210	134.03
220	137.04
230	140.02
240	142.91
250	145.78
260	148.58
270	151.36
280	154
290	156.72
300	159.36
310	161.97
320	164.43
330	167.03
340	169.52
350	172
	
#CV	
10	
15	O.L.
20	2932.08
25	2415.18
30	2086.26
35	1854.27
40	1686.5
45	1566.01
50	1489.97
55	1449.45
60	1431.15
65	1423.12
70	1419.27
75	1416.74
80	1415.02
85	1413.6
90	1412.25
95	1411.14
100	1410.09
105	1409.21
110	1408.34
115	1407.69
120	1407.15

#End of manufacturer data file