#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204592
Mfr serial number	STN11770-04592

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204592

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.11268
I_LEAK350V (microA)	0.16934
Substr Origin	125
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	60
R Bias Upper (MOhm)	1.44
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	38.13
20	53.85
30	61.5
40	67.23
50	71.97
60	76.64
70	81.46
80	86.15
90	90.42
100	94.64
110	98.52
120	102.23
130	105.86
140	109.33
150	112.68
160	116.02
170	119.27
180	122.41
190	125.53
200	128.58
210	131.62
220	134.56
230	137.47
240	140.37
250	143.19
260	145.95
270	148.73
280	151.4
290	154.02
300	156.61
310	159.18
320	161.74
330	164.31
340	166.82
350	169.34
	
#CV	
10	
15	O.L.
20	2987.44
25	2458.24
30	2122.14
35	1885.18
40	1712.76
45	1586.3
50	1503.07
55	1456.55
60	1434.53
65	1424.86
70	1420.26
75	1417.64
80	1415.73
85	1414.35
90	1413.13
95	1412.08
100	1411.1
105	1410.21
110	1409.44
115	1408.55
120	1407.91

#End of manufacturer data file