#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204597
Mfr serial number	STN11770-04597

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204597

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.11201
I_LEAK350V (microA)	0.1693
Substr Origin	125
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	60
R Bias Upper (MOhm)	1.44
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	34.67
20	51.38
30	58.94
40	64.53
50	69.27
60	74.14
70	79.33
80	84.36
90	88.99
100	93.27
110	97.32
120	101.22
130	104.94
140	108.53
150	112.01
160	115.43
170	118.75
180	121.99
190	125.17
200	128.28
210	131.35
220	134.34
230	137.28
240	140.2
250	143.06
260	145.87
270	148.62
280	151.18
290	154
300	156.66
310	159.24
320	161.79
330	164.37
340	166.86
350	169.3
	
#CV	
10	
15	O.L.
20	2920.54
25	2403.17
30	2074.21
35	1842.51
40	1676.18
45	1557.96
50	1484.31
55	1445.2
60	1427.98
65	1420.48
70	1416.81
75	1414.46
80	1412.72
85	1411.27
90	1410
95	1408.94
100	1407.9
105	1406.97
110	1406.29
115	1405.51
120	1404.82

#End of manufacturer data file