#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204598
Mfr serial number	STN11770-04598

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204598

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.11625
I_LEAK350V (microA)	0.1779
Substr Origin	125
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	60
R Bias Upper (MOhm)	1.44
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	35.82
20	52.87
30	60.54
40	66.26
50	71.21
60	76.29
70	81.77
80	87.03
90	91.87
100	96.39
110	100.68
120	104.78
130	108.73
140	112.53
150	116.25
160	119.88
170	123.42
180	126.9
190	130.29
200	133.46
210	136.93
220	140.16
230	143.34
240	146.48
250	149.56
260	152.6
270	155.59
280	158.51
290	161.42
300	164.26
310	167.07
320	169.83
330	172.55
340	175.21
350	177.9
	
#CV	
10	
15	O.L.
20	2901
25	2389.45
30	2064.56
35	1835.59
40	1671.75
45	1555.88
50	1484.39
55	1447.24
60	1430.84
65	1423.73
70	1420.18
75	1417.89
80	1416.21
85	1414.68
90	1413.51
95	1412.37
100	1411.29
105	1410.42
110	1409.63
115	1408.89
120	1408.32

#End of manufacturer data file