#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204600
Mfr serial number	STN11770-04600

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204600

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.1126
I_LEAK350V (microA)	0.17099
Substr Origin	125
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.44
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	35.37
20	51.54
30	59.09
40	64.67
50	69.48
60	74.38
70	79.59
80	84.64
90	89.3
100	93.64
110	97.75
120	101.57
130	105.45
140	109.07
150	112.6
160	116.05
170	119.42
180	122.72
190	125.93
200	129.11
210	132.21
220	135.27
230	138.24
240	141.21
250	144.14
260	146.99
270	149.8
280	152.57
290	155.3
300	158
310	160.66
320	163.28
330	165.9
340	168.44
350	170.99
	
#CV	
10	
15	O.L.
20	2905.99
25	2391.55
30	2065.08
35	1835.57
40	1671.61
45	1555.8
50	1484.94
55	1448.53
60	1432.4
65	1425.36
70	1421.66
75	1419.36
80	1417.55
85	1416.09
90	1414.97
95	1413.9
100	1412.83
105	1411.93
110	1411.08
115	1410.42
120	1409.71

#End of manufacturer data file