#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204601
Mfr serial number	STN11770-04601

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204601

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.10714
I_LEAK350V (microA)	0.16134
Substr Origin	125
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	60
R Bias Upper (MOhm)	1.44
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	35.61
20	49.35
30	56.56
40	61.88
50	66.46
60	70.98
70	75.72
80	80.58
90	85.07
100	89.21
110	93.07
120	96.82
130	100.39
140	103.78
150	107.14
160	110.37
170	113.51
180	116.58
190	119.6
200	122.54
210	125.44
220	128.29
230	131.06
240	133.81
250	136.53
260	139.18
270	141.79
280	144.37
290	146.93
300	149.44
310	151.88
320	154.29
330	156.74
340	159.11
350	161.34
	
#CV	
10	
15	O.L.
20	2898.26
25	2386.63
30	2061.75
35	1832.77
40	1668.75
45	1553.47
50	1483.12
55	1447.15
60	1431.27
65	1424.33
70	1420.67
75	1418.34
80	1416.56
85	1415.15
90	1413.96
95	1412.98
100	1412.11
105	1411.33
110	1410.56
115	1409.69
120	1408.95

#End of manufacturer data file