#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204605
Mfr serial number	STN11770-04605

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204605

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.12452
I_LEAK350V (microA)	0.2666
Substr Origin	125
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.44
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	17																																							
Pinhole	346																																							
Pinhole	408																																							
Pinhole	648																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section	
%RAWDATA	
DATA	
#IV	
10	38.88
20	56.14
30	63.75
40	70.12
50	74.5
60	79.87
70	85.43
80	90.87
90	96.03
100	101.06
110	105.89
120	110.72
130	115.49
140	119.99
150	124.52
160	129.14
170	133.74
180	138.09
190	142.93
200	147.68
210	152.46
220	157.59
230	163.05
240	168.88
250	175.05
260	180.7
270	187.2
280	195.1
290	202.9
300	211.4
310	219
320	233.2
330	245
340	261.3
350	266.6
	
#CV	
10	
15	O.L.
20	2959.72
25	2435.35
30	2102.64
35	1868.52
40	1698.87
45	1575.69
50	1496.45
55	1453.4
60	1433.51
65	1425.1
70	1420.9
75	1418.42
80	1416.62
85	1415.22
90	1413.91
95	1412.86
100	1411.88
105	1411.09
110	1410.39
115	1409.86
120	1409.26

#End of manufacturer data file