#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204606
Mfr serial number	STN11770-04606

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204606

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.13045
I_LEAK350V (microA)	0.1897
Substr Origin	125
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	60
R Bias Upper (MOhm)	1.44
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	342																																							
Pinhole	662																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA	
#IV	
10	45.91
20	65.32
30	75.21
40	82.13
50	87.47
60	92.55
70	97.72
80	102.63
90	107.19
100	111.49
110	115.57
120	119.48
130	123.13
140	126.89
150	130.45
160	133.93
170	137.32
180	140.62
190	143.88
200	147.13
210	150.3
220	153.43
230	156.47
240	159.48
250	162.44
260	165.35
270	168.22
280	171.03
290	173.79
300	176.57
310	179.32
320	181.9
330	184.5
340	187.1
350	189.7
	
#CV	
10	
15	O.L.
20	2918.21
25	2406.22
30	2079.72
35	1848.51
40	1681.27
45	1560.74
50	1484.11
55	1443.57
60	1426.02
65	1418.62
70	1414.95
75	1412.53
80	1410.72
85	1409.36
90	1408.14
95	1407.16
100	1406.28
105	1405.47
110	1404.81
115	1404.15
120	1403.42

#End of manufacturer data file