#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204607
Mfr serial number	STN11770-04607

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204607

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.10495
I_LEAK350V (microA)	0.1573
Substr Origin	125
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	291
Vdep (V)	60
R Bias Upper (MOhm)	1.44
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	379																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	34.87
20	49.2
30	56.21
40	61.4
50	65.86
60	70.43
70	75.16
80	79.69
90	83.9
100	87.81
110	91.52
120	95.06
130	98.46
140	101.75
150	104.95
160	108.08
170	111.12
180	113.96
190	116.98
200	119.83
210	122.65
220	125.38
230	128.08
240	130.73
250	133.35
260	135.92
270	138.45
280	140.95
290	143.37
300	145.77
310	148.13
320	150.46
330	152.78
340	155.02
350	157.3
	
#CV	
10	
15	O.L.
20	2922.57
25	2405.42
30	2077.58
35	1845.96
40	1679.33
45	1560.09
50	1485.56
55	1446.42
60	1428.58
65	1420.91
70	1416.89
75	1414.46
80	1412.57
85	1411.24
90	1410.16
95	1409.18
100	1408.27
105	1407.49
110	1406.82
115	1406.1
120	1405.31

#End of manufacturer data file