#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204609
Mfr serial number	STN11770-04609

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204609

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.11343
I_LEAK350V (microA)	0.17458
Substr Origin	130
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	55
R Bias Upper (MOhm)	1.44
R Bias Lower (MOhm)	1.3

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	478																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	37.69
20	51.92
30	59.47
40	65.12
50	69.97
60	74.86
70	79.96
80	85.08
90	89.89
100	94.33
110	98.48
120	102.47
130	106.26
140	109.89
150	113.43
160	116.89
170	120.26
180	123.56
190	126.8
200	129.99
210	133.11
220	136.19
230	139.22
240	142.24
250	145.2
260	148.13
270	151.03
280	153.9
290	156.77
300	159.64
310	162.55
320	165.35
330	168.46
340	171.47
350	174.58
	
#CV	
10	
15	O.L.
20	2824.54
25	2326.14
30	2009.87
35	1787.75
40	1631.32
45	1526.54
50	1465.94
55	1435.91
60	1422.69
65	1416.59
70	1413.18
75	1411.01
80	1409.23
85	1407.93
90	1406.71
95	1405.81
100	1404.91
105	1404.06
110	1403.26
115	1402.63
120	1401.88

#End of manufacturer data file