#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204622
Mfr serial number	STN11771-04622

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204622

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.13032
I_LEAK350V (microA)	0.2036
Substr Origin	130
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	55
R Bias Upper (MOhm)	1.38
R Bias Lower (MOhm)	1.28

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	41.12
20	58.61
30	66.91
40	72.93
50	78.46
60	84.74
70	91
80	96.84
90	102.22
100	107.39
110	112.26
120	116.97
130	121.54
140	125.99
150	130.32
160	134.57
170	138.41
180	142.73
190	146.72
200	150.66
210	154.56
220	158.34
230	162.07
240	165.77
250	169.37
260	172.99
270	176.21
280	179.97
290	183.4
300	186.9
310	190.4
320	193.7
330	196.98
340	200.3
350	203.6
	
#CV	
10	
15	O.L.
20	2828.02
25	2328.34
30	2010.67
35	1787
40	1628.42
45	1520.76
50	1458.87
55	1429.33
60	1416.99
65	1411.6
70	1408.43
75	1406.68
80	1404.91
85	1403.74
90	1402.36
95	1401.5
100	1400.69
105	1399.76
110	1398.94
115	1398.12
120	1397.69

#End of manufacturer data file