#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204632
Mfr serial number	STN11771-04632

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204632

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.12277
I_LEAK350V (microA)	0.18627
Substr Origin	130
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	60
R Bias Upper (MOhm)	1.38
R Bias Lower (MOhm)	1.28

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	36.75
20	57.15
30	65.04
40	70.79
50	76.06
60	81.74
70	87.29
80	92.54
90	97.47
100	102.12
110	106.53
120	110.73
130	114.86
140	118.84
150	122.77
160	126.41
170	130.2
180	133.81
190	137.33
200	140.84
210	144.3
220	147.68
230	151.01
240	154.19
250	157.34
260	160.29
270	163.58
280	166.63
290	169.69
300	172.64
310	175.46
320	178.19
330	181
340	183.9
350	186.27
	
#CV	
10	
15	O.L.
20	2922.56
25	2401.18
30	2070.5
35	1837.48
40	1669.01
45	1550.43
50	1477.42
55	1438.9
60	1421.51
65	1414
70	1410.41
75	1408.11
80	1406.41
85	1405.01
90	1403.82
95	1402.78
100	1401.81
105	1401.02
110	1400.47
115	1399.81
120	1399.1

#End of manufacturer data file