#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204636
Mfr serial number	STN11771-04636

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204636

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.14992
I_LEAK350V (microA)	0.2389
Substr Origin	130
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	293
Vdep (V)	60
R Bias Upper (MOhm)	1.38
R Bias Lower (MOhm)	1.28

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	44.19
20	65.48
30	74.97
40	82.16
50	89.29
60	96.13
70	103.47
80	110.37
90	116.78
100	122.87
110	128.68
120	134.27
130	139.7
140	145
150	149.92
160	155.25
170	160.07
180	164.94
190	169.69
200	174.39
210	178.98
220	183.6
230	188.1
240	192.5
250	196.64
260	201
270	205.2
280	209.4
290	213.6
300	217.8
310	222.1
320	226.3
330	230.5
340	234.7
350	238.9
	
#CV	
10	
15	O.L.
20	2902.66
25	2387.32
30	2059.91
35	1829.09
40	1662.81
45	1546.14
50	1474.66
55	1437.52
60	1421.11
65	1414.13
70	1410.52
75	1408.39
80	1406.64
85	1405.19
90	1403.98
95	1402.92
100	1401.98
105	1401.16
110	1400.49
115	1399.92
120	1399.46

#End of manufacturer data file