#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204637
Mfr serial number	STN11771-04637

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204637

#Test data Data section	
%DATA	
TEMPERATURE (C)	22
I_LEAK150V (microA)	0.1851
I_LEAK350V (microA)	0.2938
Substr Origin	130
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	293
Vdep (V)	60
R Bias Upper (MOhm)	1.38
R Bias Lower (MOhm)	1.28

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	54.95
20	78.87
30	90.25
40	98.5
50	108.17
60	116.98
70	125.85
80	134.16
90	142
100	149.58
110	156.87
120	163.98
130	170.98
140	178.01
150	185.1
160	192
170	198.7
180	205.7
190	212.7
200	219.8
210	227
220	234.1
230	240.6
240	244.9
250	257.3
260	263.3
270	268.7
280	273.7
290	278.1
300	281.7
310	284.7
320	287.4
330	289.8
340	291.8
350	293.8
	
#CV	
10	
15	O.L.
20	2893.27
25	2379.33
30	2052.22
35	1820.59
40	1653.22
45	1535.12
50	1464.28
55	1429.27
60	1414.27
65	1407.73
70	1404.38
75	1402.17
80	1400.61
85	1399.37
90	1398.47
95	1397.65
100	1397
105	1396.36
110	1395.77
115	1395.2
120	1394.39

#End of manufacturer data file