#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204642
Mfr serial number	STN11771-04642

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204642

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.14252
I_LEAK350V (microA)	0.2222
Substr Origin	130
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	294
Vdep (V)	60
R Bias Upper (MOhm)	1.38
R Bias Lower (MOhm)	1.28

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	40.35
20	63.24
30	72.38
40	79.21
50	85.75
60	92.62
70	99.47
80	105.87
90	111.84
100	117.32
110	122.85
120	127.99
130	132.98
140	137.82
150	142.52
160	147.1
170	151.48
180	155.86
190	160.14
200	164.12
210	168.54
220	172.67
230	176.73
240	180.9
250	184.8
260	188.63
270	192.6
280	196.4
290	199.79
300	204
310	207.7
320	211.5
330	215
340	218.6
350	222.2
	
#CV	
10	
15	O.L.
20	2909.72
25	2392.17
30	2063.59
35	1831.51
40	1664.76
45	1546.08
50	1472.41
55	1433.98
60	1416.76
65	1409.28
70	1405.58
75	1403.28
80	1401.49
85	1400.2
90	1398.95
95	1397.85
100	1397.03
105	1396.2
110	1395.7
115	1395.03
120	1394.57

#End of manufacturer data file