#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204645
Mfr serial number	STN11771-04645

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204645

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.13673
I_LEAK350V (microA)	0.2131
Substr Origin	130
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	55
R Bias Upper (MOhm)	1.38
R Bias Lower (MOhm)	1.28

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	43.47
20	61.23
30	70.33
40	76.26
50	82.34
60	88.89
70	95.54
80	101.72
90	107.44
100	112.85
110	117.99
120	122.89
130	127.43
140	132.24
150	136.73
160	141.15
170	145.36
180	149.56
190	153.69
200	157.76
210	161.78
220	165.72
230	169.34
240	173.46
250	177.23
260	181
270	184.7
280	188.25
290	192
300	195.5
310	199
320	202.7
330	206.2
340	209.7
350	213.1
	
#CV	
10	
15	O.L.
20	2808.97
25	2312.06
30	1996.51
35	1774.73
40	1618.83
45	1515.41
50	1457.81
55	1431.17
60	1420.39
65	1415.43
70	1412.59
75	1410.51
80	1408.91
85	1407.75
90	1406.62
95	1405.77
100	1404.94
105	1404.17
110	1403.45
115	1402.72
120	1401.92

#End of manufacturer data file