#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204646
Mfr serial number	STN11771-04646

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204646

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.2
I_LEAK350V (microA)	0.3643
Substr Origin	130
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	292
Vdep (V)	55
R Bias Upper (MOhm)	1.38
R Bias Lower (MOhm)	1.28

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	12.407
20	52.84
30	60.21
40	66.48
50	77.48
60	96.87
70	114.97
80	128.66
90	139.64
100	150.98
110	160.94
120	171.76
130	180.29
140	190.9
150	200
160	208.9
170	218.1
180	228.5
190	238.2
200	249.5
210	259
220	268.8
230	277.4
240	288.2
250	296.1
260	305
270	314.9
280	322.7
290	327.9
300	334.9
310	341.8
320	348.7
330	353.8
340	358
350	364.3
	
#CV	
10	
15	O.L.
20	2881.91
25	2371.67
30	2047.55
35	1819.32
40	1656.68
45	1542.9
50	1474.14
55	1439.54
60	1424.94
65	1418.59
70	1415.29
75	1413.14
80	1411.5
85	1410.16
90	1409.07
95	1408.03
100	1407.14
105	1406.38
110	1405.53
115	1404.76
120	1404.05

#End of manufacturer data file