#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204650
Mfr serial number	STN11775-04650

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204650

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.1271
I_LEAK350V (microA)	0.2022
Substr Origin	131
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.43
R Bias Lower (MOhm)	1.31

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	429																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	37.23
20	53.74
30	62.15
40	68.77
50	74.87
60	80.99
70	87.16
80	93
90	98.52
100	103.74
110	108.7
120	113.5
130	118.18
140	122.69
150	127.1
160	131.45
170	135.72
180	139.89
190	144.03
200	148.08
210	152.11
220	156.07
230	159.91
240	163.51
250	167.46
260	171.16
270	174.83
280	178.42
290	181.8
300	185.4
310	188.8
320	191.9
330	195.3
340	198.8
350	202.2
	
#CV	
10	
15	O.L.
20	2904.21
25	2390.37
30	2063.21
35	1833.95
40	1668.3
45	1552.25
50	1481.22
55	1443.77
60	1426.76
65	1419.42
70	1415.88
75	1413.61
80	1412.1
85	1410.74
90	1409.68
95	1408.66
100	1407.75
105	1407.07
110	1406.54
115	1405.85
120	1405.29

#End of manufacturer data file