#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204651
Mfr serial number	STN11775-04651

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204651

#Test data Data section	
%DATA	
TEMPERATURE (C)	26
I_LEAK150V (microA)	0.1194
I_LEAK350V (microA)	0.1868
Substr Origin	131
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.43
R Bias Lower (MOhm)	1.31

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	36.42
20	51.86
30	59.65
40	65.5
50	71
60	76.92
70	82.68
80	88.05
90	93.12
100	97.92
110	102.36
120	106.95
130	111.22
140	115.36
150	119.4
160	123.38
170	127.24
180	131.03
190	134.77
200	138.4
210	141.97
220	145.5
230	148.98
240	152.4
250	155.76
260	159.11
270	162.38
280	165.59
290	168.79
300	171.94
310	174.95
320	178.07
330	180.9
340	183.8
350	186.8
	
#CV	
10	
15	O.L.
20	2936.08
25	2415.49
30	2084.63
35	1852.17
40	1682.78
45	1562.21
50	1486.32
55	1445.7
60	1427.29
65	1419.34
70	1415.6
75	1413.26
80	1411.61
85	1410.32
90	1409.19
95	1408.22
100	1407.34
105	1406.68
110	1406.04
115	1405.41
120	1404.89

#End of manufacturer data file