#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204656
Mfr serial number	STN11775-04656

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204656

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.11936
I_LEAK350V (microA)	0.1902
Substr Origin	131
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	55
R Bias Upper (MOhm)	1.43
R Bias Lower (MOhm)	1.31

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	35.27
20	51.77
30	59.41
40	65.09
50	70.79
60	76.84
70	82.52
80	87.82
90	92.87
100	97.66
110	102.29
120	106.73
130	111.07
140	115.26
150	119.36
160	123.17
170	127.34
180	131.23
190	135.06
200	138.82
210	142.55
220	146.23
230	149.87
240	153.46
250	157.01
260	160.53
270	163.97
280	167.35
290	170.67
300	174.11
310	177.52
320	180.69
330	183.9
340	187.2
350	190.2
	
#CV	
10	
15	O.L.
20	2787.46
25	2293.64
30	1979.26
35	1759.45
40	1604.25
45	1504.97
50	1452.56
55	1428.77
60	1419.15
65	1414.69
70	1412.1
75	1410.36
80	1408.92
85	1407.73
90	1406.76
95	1405.81
100	1405.06
105	1404.34
110	1403.73
115	1403.3
120	1402.68

#End of manufacturer data file