#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204657
Mfr serial number	STN11775-04657

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204657

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.1968
I_LEAK350V (microA)	0.2922
Substr Origin	131
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.43
R Bias Lower (MOhm)	1.31

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	730																																							
Pinhole	746																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA	
#IV	
10	78.9
20	106.84
30	123.08
40	134.19
50	142.23
60	149.24
70	155.68
80	161.7
90	167.36
100	172.73
110	177.74
120	182.7
130	187.5
140	192.2
150	196.8
160	201.3
170	205.6
180	210
190	214.3
200	218.6
210	222.8
220	226.9
230	231.1
240	235.1
250	239.2
260	243.2
270	247.2
280	250.9
290	254.8
300	258.9
310	262.9
320	267
330	271.8
340	278.9
350	292.2
	
#CV	
10	
15	O.L.
20	2921.27
25	2415.64
30	2089.27
35	1856.12
40	1683.54
45	1560.03
50	1484.28
55	1445.16
60	1428.17
65	1420.85
70	1417.21
75	1415.05
80	1413.4
85	1412.14
90	1411.02
95	1410.1
100	1409.25
105	1408.49
110	1407.91
115	1407.22
120	1406.61

#End of manufacturer data file