#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204659
Mfr serial number	STN11775-04659

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204659

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.10959
I_LEAK350V (microA)	0.17351
Substr Origin	131
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	290
Vdep (V)	60
R Bias Upper (MOhm)	1.43
R Bias Lower (MOhm)	1.31

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole	511																																							
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	33.51
20	47.72
30	54.78
40	60.53
50	65.52
60	70.69
70	75.87
80	80.82
90	85.45
100	89.84
110	94.03
120	98.12
130	102.02
140	105.86
150	109.59
160	113.28
170	116.65
180	120.42
190	123.83
200	127.31
210	130.64
220	134.02
230	137.23
240	140.53
250	143.59
260	146.75
270	149.68
280	152.76
290	155.77
300	158.83
310	161.83
320	164.78
330	167.85
340	170.69
350	173.51
	
#CV	
10	
15	O.L.
20	2922.93
25	2404.06
30	2073.15
35	1842.39
40	1674.24
45	1555.35
50	1482.57
55	1444.56
60	1427.17
65	1419.56
70	1416
75	1413.76
80	1412.03
85	1410.88
90	1409.73
95	1408.72
100	1408.04
105	1407.28
110	1406.76
115	1406.1
120	1405.59

#End of manufacturer data file