#General information ITEM section	
%ITEM	
SERIAL NUMBER	20220900204662
Mfr serial number	STN11775-04662

#Test information Test section	
%TEST	
TEST DATE (DD/MM/YYYY)	30/08/2001
PROBLEM	NO
PASSED	YES
Run number	20220900204662

#Test data Data section	
%DATA	
TEMPERATURE (C)	25
I_LEAK150V (microA)	0.10596
I_LEAK350V (microA)	0.16536
Substr Origin	131
Substr Orient	111
Substr R Upper (kOhm.cm)	8
Substr R Lower (kOhm.cm)	4
Thickness (micron)	288
Vdep (V)	60
R Bias Upper (MOhm)	1.43
R Bias Lower (MOhm)	1.31

#Comment section	
%COMMENT	



#Defects section	
%DEFECT																																								
#DEFECT NAME																																								
Implant-Open																																								
Implant-Short																																								

Oxide-Punchthrough																																								
Pinhole																																								
Short																																								
Open																																								

%WEBLINK																																								
#DESCRIPTION	URL																																							

#IV raw data Raw data section																																								
%RAWDATA																																								
DATA																																								
#IV	
10	32.85
20	46.74
30	53.48
40	58.67
50	63.9
60	68.91
70	73.85
80	78.5
90	82.94
100	87.12
110	91.14
120	95.01
130	98.76
140	102.4
150	105.96
160	109.44
170	112.84
180	116.2
190	119.5
200	122.76
210	125.96
220	129.13
230	132.24
240	135.32
250	138.35
260	141.35
270	144.3
280	146.99
290	149.68
300	152.42
310	154.83
320	157.37
330	160.15
340	162.6
350	165.36
	
#CV	
10	
15	O.L.
20	2963.06
25	2435.9
30	2099.37
35	1864.22
40	1693.78
45	1572.12
50	1494
55	1450.66
60	1430.44
65	1421.62
70	1417.57
75	1415.25
80	1413.61
85	1412.35
90	1411.15
95	1410.35
100	1409.48
105	1408.83
110	1408.28
115	1407.66
120	1407.17

#End of manufacturer data file